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on Electronics for LHC Experiments Krakow, Poland, 11 - 15 September 2000 RADIATION & MAGNETIC FIELD TOLERANT ELECTRONICS SYSTEMS |
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on Electronics for LHC Experiments Krakow, Poland, 11 - 15 September 2000 RADIATION & MAGNETIC FIELD TOLERANT ELECTRONICS SYSTEMS |
Back
to the main page |
CMS
ECAL APD quality assurance facility
Alexander Singovski,
University of Minnesota, Minneapolis, USA
K. Deiters,Q.Ingram,D.Renker,T. Sakhelashvili,B. Patel, R. Rusack,
A. Singovski, P. Vikas, Y. Musienko,S. Nicol,S. Reucroft,J. Swain
Measurements
of Radiation Effects on the Timing, Trigger and Control Receiver (TTCrx)
ASIC
Thomas Toifl, CERN, Geneva,
Switzerland
T. Toifl, P. Moreira and A. Marchioro
Results
of Radiation Test of the Cathode Front-end Board for CMS Endcap Muon Chambers
Ta-Yung Ling, The Ohio
State University, Columbus, Ohio, USA
B. Bylsma, L.S. Durkin, J. Gu, T.Y. Ling, M. Tripathi
Radiation
Tolerance Evaluation of the ATLAS RPC Coincidence Matrix Submicron Technology
Riccardo Vari,
INFN, Roma, Italy
E. Gennari, E. Petrolo, A. Salamon, R. Vari, S. Veneziano
First
Evaluation of Neutron Induced Single Event Effects on the CMS Barrel Muon
Electronics
Pierluigi Zotto,
Politecnico, Milano, Italy and INFN, Padova, Italy
S. Agosteo, L. Castellani, G. D’Angelo, A. Favalli, I. Lippi, R.
Martinelli and P. Zotto
Single
Event Upset tests of an 80Mbit/s optical receiver
Federico Faccio, CERN,
Geneva, Switzerland
F. Faccio, G. Berger, K. Gill, M. Huhtinen, A. Marchioro, P. Moreira,
F. Vasey
Redundancy
or GaAs? Two different approaches to solve the problem of SEU (Single Event
Upset ) in a Digital Optical Link.
Bernard Dinkespiler,
Southern Methodist University, Dallas, TX, USA
M.-L. Andrieux, B. Dinkespiler, L. Gallin-Martel, J. Lundquist,
M. Pearce, F. Rethore, S. Rydstrom, R. Stroynowski, S. Xie, J. Ye
Single
Event Effect Measurements on the Resistive Plate Chambers Front-End Chips
for the CMS Experiment
Antonio Ranieri,
Università e INFN, Bari, Italy
M. Abbrescia, S. Altieri, G. Belli, G. Bruno, A. Colaleo, R. Guida,
G. Iaselli, F. Loddo, M. Maggi, B. Marangelli, S. Natali, S. Nuzzo, G.
Pugliese, A. Ranieri , S.P. Ratti, C. Riccardi, F. Romano, P. Torre, P.
Vitulo
Single
Event Upset Studies on the APV25 Front End Readout Chip
Jonathan Fulcher, Imperial
College, London, UK
JR Fulcher, D Bisello, F Faccio, M French, G Hall, M Huhtinen, L
Jones, E Noah, M Raymond, A Paccagnella, J Wyss
Overview
of ATLAS LAr Radiation Tolerance
Christophe de La Taille,
LAL, Orsay, France
Overview
of the ATLAS Policy on Radiation Tolerant Electronics
Martin Dentan, CERN,
Geneva, Switzerland and CEA-DAPNIA, Gif-sur-Yvette, France
on behalf of the ATLAS Radiation Hardness Assurance Working Group
Instrumentation
Amplifiers and Voltage Controlled Current Sources for LHC cryogenic Instrumentation
Juan Agapito, Universidad
Complutense (UCM), Electronics Dept., Madrid, Spain
J.A. Agapito , N.P. Barradas, F.M. Cardeira , J. Casas , A.P.
Fernandes , F.J. Franco, P. Gomes, I.C. Goncalves , A.H. Cachero
, J. Lozano, M.A. Martin, J.G. Marques, A. Paz , M.J. Prata, A.J.G. Ramalho,
M.A. Rodriguez Ruiz, J.P. Santos and A. Vieira
Developments
for Radiation Hard Silicon Detectors by Defect Engineering - Results by
the CERN RD48 (ROSE) Collaboration
Gunnar Lindstroem, University
of Hamburg, Germany
on behalf of the CERN RD48 (ROSE) Collaboration